Hu, X.; Rousseau, R.; Chen, J.: ¬A new approach for measuring the value of patents based on structural indicators for ego patent citation networks (2012)
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- Abstract
- Technology sectors differ in terms of technological complexity. When studying technology and innovation through patent analysis it is well known that similar amounts of technological knowledge can produce different numbers of patented innovation as output. A new multilayered approach to measure the technological value of patents based on ego patent citation networks (PCNs) is developed in this study. The results show that the structural indicators for the ego PCN developed in this contribution can characterize groups of patents and, hence, in an indirect way, the health of companies.
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